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74LVC38ABQ Fiches technique(PDF) 7 Page - NXP Semiconductors |
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74LVC38ABQ Fiches technique(HTML) 7 Page - NXP Semiconductors |
7 / 14 page 2004 Mar 22 7 Philips Semiconductors Product specification Quad 2-input NAND gate (open drain) 74LVC38A AC CHARACTERISTICS GND = 0 V; tr =tf ≤ 2.5 ns. Notes 1. All typical values are measured at Tamb =25 °C. 2. These typical values are measured at VCC = 3.3 V. 3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design. SYMBOL PARAMETER TEST CONDITIONS MIN. TYP MAX. UNIT WAVEFORMS VCC (V) Tamb = −40 to +85 °C; note 1 tPZL propagation delay nA, nB to nY see Figs 6 and 7 1.2 − 5.7 − ns 2.7 0.5 1.7 2.9 ns 3.0 to 3.6 0.5 1.7(2) 3.0 ns tPLZ propagation delay nA, nB to nY see Figs 6 and 7 1.2 − 4.8 − ns 2.7 1.0 2.6 3.8 ns 3.0 to 3.6 1.0 2.3(2) 3.6 ns tsk(0) skew note 3 −− 1.0 ns Tamb = −40 to +125 °C tPZL propagation delay nA, nB to nY see Figs 6 and 7 1.2 −−− ns 2.7 0.5 − 4.0 ns 3.0 to 3.6 0.5 − 4.0 ns tPLZ propagation delay nA, nB to nY see Figs 6 and 7 1.2 −−− ns 2.7 1.0 − 5.0 ns 3.0 to 3.6 1.0 − 4.5 ns tsk(0) skew note 3 −− 1.5 ns |
Numéro de pièce similaire - 74LVC38ABQ |
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Description similaire - 74LVC38ABQ |
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